Quickly and easily measure your
complex optics with the Præcis
3-D Profiler. Customized to your
application, the Praecis Profiler
can characterize freeform and
non-axisymmetric parts to the
nanometric level.
Improve the performance of
your instrumentation with the
Præcis Environment enclosure.
The Environment system main-
tains the thermal environment
of your instrument to .01 ºC.
AOMATT 2012 26 – 29 April, 2012 Dan Thompson will be presenting a paper entitled, "Error Budgeting as Applied to the Design of the International X-Ray Observatory Mandrel Measuring Machine.